Keynote lecture on "Microwave imaging techniques and applications: from basic concepts to recent developments" @ IEEE International School of Imaging
The AEM group will hold a keyonote lecture on "Microwave imaging techniques and applications: from basic concepts to recent developments" at the IEEE International School of Imaging, which takes place on August 24-26, 2021, in New York, USA, in conjuction with the IEEE International Conference on Imaging Systems and Techniques.
Lectures: Prof. Matteo Pastorino and Prof. Andrea Randazzo
Summary: Microwave imaging (MI) is a class of nondestructive and noninvasive techniques aimed at inspecting targets starting from measurements of the electromagnetic field they scatter when illuminated with an incident radiation at microwave frequencies. The aim is to extract information about some of the geometrical/physical properties (e.g., the distributions of the dielectric properties) of the targets under test, often provided to the users in the form of images. However, the underlying inverse-scattering problem poses significant theoretical, numerical, and practical aspects that make this technique quite difficult and challenging. MI has been thus considered an emerging field for a long time. Across the years, engineers and scientists in universities and many other institutions devoted significant efforts in the development of new and innovative solutions, to face the challenging problem of developing effective measurement systems and data processing algorithms. Recent developments, however, allow to consider it a promising tool in several applications, such as nondestructive testing and evaluations, subsurface prospection, security, and medical imaging. In this lecture, MI techniques and their application in different fields will be reviewed. After an introduction concerning the basic concepts of the electromagnetic inverse problem (which is the basic theory of MI methods), some of the commonly adopted approaches are discussed, together with information about the related systems. Some specific examples in different applicative fields will also be provided. Finally, recent developments and future trends will be addressed.
Web site: IEEE International School of Imaging Keynote Lectures